Surface Characterization of Zr-O/W System at High Temperature

Suchan LEE; Hitosi TAMURA; Masahiko INOUE; Ryuichi SHIMIZU

doi:10.1380/jsssj.15.268

高温におけるZr-O/W系の表面組成に関する研究

李壽燦, 田村仁志, 井上雅彦, 志水隆一

著者情報

ジャーナルフリー

1994 年 15 巻 4 号 p. 268-272

DOI https://doi.org/10.1380/jsssj.15.268

詳細

発行日: 1994/06/01 受付日: 1994/02/16 J-STAGE公開日: 2009/08/07 受理日: 1994/03/03 早期公開日: - 改訂日: -
訂正情報
訂正日: 2009/08/07 訂正理由: - 訂正箇所: 論文抄録訂正内容: Wrong : Surface chemical analysis of Zr-O/W system was performed at two different sample temperatures, room temperature and &sim;1600 K, by using Auger electron spectroscopy (AES) and ion scattering spectroscopy (ISS). Depositing Zr onto a polycrystalline W-substrate the surface was exposed to oxygen. AES and ISS measurements have revealed that the oxygen adsorbed on the Zr/W surface at room temperature diffuses into Zr/W at &sim;1600 K, keeping a major part of Zr remained on the outermost atomic layer. This result strongly supports the model proposed by Danielson and Swanson for Zr-O/W (100) system that the oxygen adsorbed on the Zr/W (100) surface at room temperature diffuses into the Zr/W (100) as a composite Zr-O at high temperature and this results in considerable decrease of work function, leading the Zr-0/W (100) system to an electron source of high brightness.
Right : Surface chemical analysis of Zr-O/W system was performed at two different sample temperatures, room temperature and ∼1600 K, by using Auger electron spectroscopy (AES) and ion scattering spectroscopy (ISS). Depositing Zr onto a polycrystalline W-substrate the surface was exposed to oxygen. AES and ISS measurements have revealed that the oxygen adsorbed on the Zr/W surface at room temperature diffuses into Zr/W at ∼1600 K, keeping a major part of Zr remained on the outermost atomic layer. This result strongly supports the model proposed by Danielson and Swanson for Zr-O/W (100) system that the oxygen adsorbed on the Zr/W (100) surface at room temperature diffuses into the Zr/W (100) as a composite Zr-O at high temperature and this results in considerable decrease of work function, leading the Zr-0/W (100) system to an electron source of high brightness.

抄録

Surface chemical analysis of Zr-O/W system was performed at two different sample temperatures, room temperature and ∼1600 K, by using Auger electron spectroscopy (AES) and ion scattering spectroscopy (ISS). Depositing Zr onto a polycrystalline W-substrate the surface was exposed to oxygen. AES and ISS measurements have revealed that the oxygen adsorbed on the Zr/W surface at room temperature diffuses into Zr/W at ∼1600 K, keeping a major part of Zr remained on the outermost atomic layer. This result strongly supports the model proposed by Danielson and Swanson for Zr-O/W (100) system that the oxygen adsorbed on the Zr/W (100) surface at room temperature diffuses into the Zr/W (100) as a composite Zr-O at high temperature and this results in considerable decrease of work function, leading the Zr-0/W (100) system to an electron source of high brightness.

責任著者(Corresponding author)

訂正情報

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