表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
半導体表面の成長機構と第一原理計算
押山 淳
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ジャーナル フリー

1998 年 19 巻 3 号 p. 141-146

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Density Functional Calculations which have been performed in order to reveal mechanisms of semiconductor epitaxial growth are reviewed. Two topics are discussed: First, appearance of {311} facets during the epitaxial growth on Si (100) surfaces; secondly precipitation of group V atoms during surfactant-mediated epitaxial growth of Ge on Si(100). In the first topic it is shown that step bunching inherent to Si(100) leads naturally to the {311} facet. In the second it is emphasized that the first adsorption geometry is crucial to the precipitation. Capability and possibility of first-principles calculations are emphasized.
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© 社団法人 日本表面科学会
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