表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
電子顕微鏡像のディジタル画像処理による物質構造解析
金谷 光一
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ジャーナル フリー

1984 年 5 巻 3 号 p. 321-331

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A digital processing method with the aid of a scanning densitometer system for image analysis of electron micrographs was successfully applied to biological specimens as well as thin films.
Based on Fourier techniques for structural analysis from a computer-generated diffractogram, some of the known structural features were confirmed, but other unknown details were established from a superposition of individual harmonic images, where the enhanced scattering amplitude and corrected phase are inversely transformed from the selected diffraction patterns.
The noise removal and image enhancement are most serious problems for a digital structural analysis.
From the digital processed data when the noise removal and in addition, the image enhancement are preliminarily processed, a Fourier synthesis representing the precise location and subsequent three-dimensional arrangement of atoms or molecules is derived.

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