表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
MDSによる界面の評価
西垣 敏
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ジャーナル フリー

1985 年 6 巻 4 号 p. 310-314

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Metastable-atom de-excitation spectroscopy (MDS) is a powerful technique to study the electronic structures of the outermost atomic layers of solid surfaces. In this paper we give an outline of the mechanism of metastable-atom de-excitation followed by electron emission from surfaces. Some recent results of its application to the study on adsorption and thin film growth are reviewed and a unique role of the MDS method in charaterizing interface structures is discussed.

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