抄録
The three-grid type LEED-AES system with high sensitivity has been developed. In this system, the perturbing ac voltage has been applied on the sample instead of the retarding grid, and the fourth grid of ordinary four-grid type has been eliminated. It has been shown firstly that the sensitivity is improved, since electron transmission is increased and the noise caused by secondary electron emission from the fourth grid is eliminated from the Auger electron signal. Secondly the voltage on the screen induced by perturbing voltage has been reduced almost completely because the all grids are grouned with small impedance. Finally, because of removing the fourth grid, the LEED pattern has been observed more clearly than the four-grid system.
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