Journal of the Vacuum Society of Japan
Online ISSN : 1882-4749
Print ISSN : 1882-2398
ISSN-L : 1882-2398
解説
収差補正電子顕微鏡によるナノカーボン物質の構造評価
佐藤 雄太末永 和知
著者情報
ジャーナル フリー

2011 年 54 巻 4 号 p. 264-269

詳細
抄録

  Recent development of spherical aberration correctors for transmission electron microscopes (TEM) and scanning TEM (STEM) has enabled atomic-resolution imaging of nanocarbon materials even at relatively low electron acceleration voltages around and below 100 kV. In this article, we review some recent studies on carbon nanotubes (CNTs) and fullerene nanopeapods using aberration-corrected TEM/STEM. Local structure of each individual CNT can be visualized in details including point defects such as atomic vacancies and adatoms in aberration-corrected TEM images. Atomic-level structures of fullerene molecules and their orientation inside a CNT can be unambiguously observed. Identification of single metal atoms such as calcium and lanthanides in nanopeapods by using STEM-EELS operated at 60 kV is also presented.

著者関連情報
© 2011 一般社団法人日本真空学会
前の記事 次の記事
feedback
Top