2009 Volume 44 Issue 2 Pages 145-148
A novel characterization technique based on atomic force microscopy (AFM) is introduced, where AFM is utilized as nano-scale palpation technique. The technique maps surface mechanical properties of polymeric materials as well as their artifact-free true topographic images. Several analytical models those can be used in this technique and their applicable limits are also discussed. Finally, a example to exhibit the advantage of this technique is shown.