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AFM Characterization for Mechanical Properties of Polymeric Materials
Ken NakajimaSo FujinamiToshio Nishi
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2009 Volume 44 Issue 2 Pages 145-148

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Abstract

A novel characterization technique based on atomic force microscopy (AFM) is introduced, where AFM is utilized as nano-scale palpation technique. The technique maps surface mechanical properties of polymeric materials as well as their artifact-free true topographic images. Several analytical models those can be used in this technique and their applicable limits are also discussed. Finally, a example to exhibit the advantage of this technique is shown.

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© 2009 The Japanese Society of Microscopy
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