New Microscope Combines Optical and Electrical Excitation into a Single Scanning Tunneling Microscope Unit for Simultaneous Characterization of Near-field Luminescence from Individual Nanostructures

Abstract

For the purpose of simultaneous electrical and optical characterization of light emission from individual nanostructures on semiconductor surfaces at the near-field, we developed a new microscope in which optical and electric excitation is combined into a single scanning tunneling microscope-based unit through the optical design of transparent probes. We describe the proof-of-concept measurements on GaAs and GaAs/AlAs heterostructures.