KENBIKYO
Online ISSN : 2434-2386
Print ISSN : 1349-0958
Reviews
Evolution and Prospects of High Resolution Electron Microscopy
Yoshizo Takai
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JOURNALS FREE ACCESS

2011 Volume 46 Issue 4 Pages 246-252

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Abstract

High-resolution electron microscopy is entering a new era with the development of aberration correction electron optics. Thanks to the steady efforts of researchers over a period of 50 years, this development enables us to directly observe individual light atoms such as carbon and oxygen as well as single molecules and impurities in bulk solids. High-resolution electron microscopes are now indispensable tools to facilitate nanotechnology studies in many fields. In the present review, a brief history of the development of aberration correction is outlined, and some future directions using the technique are summarized including a discussion on phase plates.

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© 2011 The Japanese Society of Microscopy
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