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Applications Using Ion-Beam Serial Milling and Reconstruction Technique in Life Science
Shoji SadayamaKaoru MurataNaohisa Suzuki
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2011 Volume 46 Issue 4 Pages 273-276

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Abstract

FIB/SEM (DualBeamTM) is well known system as one of the best system for failure analysis in material science field. Ion-beam serial milling and reconstruction is a 3D reconstruction technique using a combination of DB and computed tomography technique. The technique is an important application of DB in material science field. Now it becomes popular in life science field gradually. Then we introduce its technique and application for life science field.

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© 2011 The Japanese Society of Microscopy
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