Online ISSN : 2434-2386
Print ISSN : 1349-0958
Feature Articles: Fundamentals of Simulation for Electron Microscopy
Image Simulation for High-Resolution Electron Microscopy
Kazuo Ishizuka
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2015 Volume 50 Issue 1 Pages 11-15


Both (Conventional) Transmission Electron Microscopy (CTEM) and Scanning Transmission Electron Microscopy (STEM) give atomic resolution images under optimum conditions. However, in order to confirm the proposed structure based on the micrographs we need image simulation. Image simulation program will give some images, when we provide sample information and imaging conditions. However, CTEM and STEM images are generated from different signals, and the effect of the objective lens differs between two imaging modes. Thus, in order to evaluate the simulated images we have to understand the fundamental ideas as well as basic concepts of image simulation. In this article, I will explain, based on the multislice method, the fundamentals of high-resolution image simulation, especially the techniques to estimate elastic and thermal diffuse scattering and to handle partial coherence.

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© 2015 The Japanese Society of Microscopy
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