2020 Volume 55 Issue 1 Pages 3-6
SEM observation of resin-embedded sections is attracting attention as a method to observe wide area of an organ cross section and also to grasp 3D structure of it by observing serially sectioned samples. In the section observation, not only observing conditions such as selection of the detector or acceleration voltage but also sample pretreatment factors such as thickness of the section or choice of the substrate are complicatedly related to each other. It is important to understand characteristics of the SEM to use and to select appropriate pretreatments and observing conditions. This article explains the differences made by selection of acceleration voltage, sample thickness, and pretreatments in backscattered electron images mainly used in SEM observation of sections.
