2025 Volume 60 Issue 2 Pages 79-82
A new method for electron wave phase measurement has been developed using structured illumination with non-uniform amplitude and phase distributions combined with ptychographic wavefield reconstruction. The proposed method utilizes full-field illumination of non-uniformly structured electron beams generated by a conductive film with random openings. It reconstructs the complex transmission function of the specimen from a series of in-line holograms acquired with different illumination positions. A simulation study under practical conditions with a total of 2.1 × 108 electrons demonstrated phase reconstruction with a standard deviation error of 0.024 rad. The method was further validated using experimental holograms obtained from MgO particles. The reconstructed phase was consistent with the results expected from the particle shape and was equivalent to a mean inner potential close to previously reported values.
