KENBIKYO
Online ISSN : 2434-2386
Print ISSN : 1349-0958
Low voltage and ultra-high resolution BSE imaging of ultramicrotomed, cross-sectional surfaces
Kenichi Shimizu, Sigeaki Tachibana, Tomoaki Mitani, Hiroki Habazaki
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Keywords: FE-SEM, Sample preparation, Ultramicrotomy, BSE imaging
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2007 Volume 42 Issue 1 Pages 45-49

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