59 巻 (1993) 559 号 p. 627-633
Joining residual stresses at the ceramic near the interface were measured nondestructively by the X-ray method for the Si3N4-S45C joints. Four specimens of different sizes were used to clarify the influence of size on the distribution of the residual stresses and the change of the intensity of the stress singularity. Analytical studies on the joining residual stresses for the Si3N4-S45C joint specimen were performed using the finite-element method. The intensity of the residual stress singular field is proportional to the ratio between the interface length and the interlayer length. It is also proportional to the interface length raised to the λ power.