74 巻 (2008) 738 号 p. 179-184
CRIEPI has developed a highly accurate, low cost flaw depth sizing technique in ultrasonic nondestructive inspection, which is easy-to-use in comparison to standard techniques such as crack tip diffraction and TOFD techniques. This technique is called the short path of diffraction (SPOD) technique. This paper deals with essential parameter such as vibration mode, refracted angle and probe separation for back surface breaking flaws.