抄録
In spite of recent advance in high-speed electronics reaching pico-second time regime, instrumentation means for their evaluations and testings are lacking. Pure electrical means is pointed out to have an inevitable limitation on its speed. Optical means can provide very short light pulses, which might be utilized to overcome the limitation in pure electrical means. Optical sampling technique is based upon recent availability of this very short optical pulse. Various optical sampling techniques are reveiewed on the general common concept of samplingtechnique and advantages of optical sampling are stressed.
