MATERIALS TRANSACTIONS
Online ISSN : 1347-5320
Print ISSN : 1345-9678
ISSN-L : 1345-9678
High-Resolution Electron Microscopy of a Subgrain Boundary in Strontium Titanate Single Crystal
Junji Yamanaka
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2001 Volume 42 Issue 6 Pages 1131-1134

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Abstract

The microstructure of subgrain boundaries in as-annealed non-doped SrTiO3 single crystals was studied. When the crystal quality is good, it is difficult to observe lattice defects using only transmission electron microscopy (TEM). In such cases, pre-observation by X-ray topography is useful. Hence, the author used both TEM and X-ray topographic techniques. X-ray topographs showed the defect distribution throughout the crystals. [011]-Type crystals generally have subgrain textures. High-resolution transmission electron microscopy revealed that the subgrain boundaries were small-angle tilt boundaries formed by partial dislocations of 1⁄2⟨110⟩ Burgers vectors and there were no segregation of impurities.

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© 2001 The Japan Institute of Metals and Materials
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