MATERIALS TRANSACTIONS
Online ISSN : 1347-5320
Print ISSN : 1345-9678
Cross Sectional TEM Observation of Gas-Ion-Irradiation Induced Surface Blisters and Their Precursors in SiC
Shunsuke MutoTetsuo TanabeTadashi Maruyama
Author information
JOURNALS FREE ACCESS

2003 Volume 44 Issue 12 Pages 2599-2604

Details
Abstract

Cross sectional structures of surface blisters and their precursors in SiC formed by H+, D+ and He+ irradiation were examined with transmission electron microscopy and electron energy-loss spectroscopy. The substructures of the H+- and D+-irradiated samples showed similar features, and experimental results suggested that H2 and CH4 bubbles nucleated after H(D)-trapping sites were saturated and the first nucleated bubbles grew by absorbing the gas molecules formed by further ion irradiation, followed by lift-up of the surface layer with increasing the internal pressure. The implanted hydrogen atoms other than those forming bubbles were scattered in atomic form, preferably bonded to carbon atoms. On the other hand the substructure of He+ irradiated sample was very similar to that of metals and other materials irradiated by He+, and it is considered that the formation mechanism of He-blister is common for most materials.

Information related to the author
© 2003 The Japan Institute of Metals and Materials
Previous article Next article
feedback
Top