2009 Volume 50 Issue 7 Pages 1655-1659
The three dimensional x-ray diffraction (3DXRD) concept is shortly described and new experimental updates are highlighted. The potentials and limitation of the 3DXRD method are compared to those of other 3D methods. 3DXRD has been used for in-situ studies of recrystallization and new migration rate results are presented. Migration mechanism for boundary segments surrounding a recrystallizing grain are described and discussed.