MATERIALS TRANSACTIONS
Online ISSN : 1347-5320
Print ISSN : 1345-9678
Four-Dimensional Morphological Evolution of an Aluminum Silicon Alloy Using Propagation-Based Phase Contrast X-ray Tomographic Microscopy
Emine Begum GulsoyAshwin J. ShahaniJohn W. GibbsJulie L. FifePeter W. Voorhees
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2014 Volume 55 Issue 1 Pages 161-164

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Abstract

Four-dimensional propagation-based phase contrast X-ray tomographic microscopy experiments were performed on an Aluminum-29.9 mass% Silicon alloy during coarsening. Using propagation-based phase contrast, changes in the three-dimensional morphology of primary silicon particles were captured and the resulting evolution of the microstructure is discussed. While morphologies at earlier times are complex, faceted and highly interconnected, the morphologies at later times are less faceted but remain quite complex.

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© 2013 The Japan Institute of Metals and Materials
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