Advanced Electron Microscopy for Materials Science

Zentaro Akase; Mitsuaki Higo; Keiko Shimada; Takafumi Sato; Hideyuki Magara; Daisuke Shindo; Nobuhiko Ohno

doi:10.2320/matertrans.MT-M2021086

Current Trends in Research

Advanced Electron Microscopy for Materials Science

Zentaro Akase, Mitsuaki Higo, Keiko Shimada, Takafumi Sato, Hideyuki Magara, Daisuke Shindo, Nobuhiko Ohno

著者情報

キーワード: electron holography, dynamical diffraction, in situ experiment, electric field, secondary electron

ジャーナルフリー HTML

2021 年 62 巻 10 号 p. 1589-1595

DOI https://doi.org/10.2320/matertrans.MT-M2021086

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詳細

抄録

This paper presents current research trends in advanced electron microscopy techniques for materials science. The survey is based on the special issue of Materials Transactions published in October 2019 (Vol. 60, No. 10). Advanced electron microscopy has been applied extensively to characterize various materials. The recent development and extension of analyses of electric fields and the collective motions of secondary electrons by in situ electron holography are discussed in detail.

Fig. 4 (a) Reconstructed phase image of ultramicrotomed epoxy resin. (b) Reconstructed amplitude image of resin. (c) Reconstructed phase image of FIB processed resin. (d) Reconstructed amplitude image of FIB processed resin.¹⁹⁾ Fullsize Image

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