Atomically Resolved Scanning Tunneling Microscopy of Cleaved Chalcopyrite Surface

Abstract

Information on the microstructure of copper minerals is important for more detailed understanding and control of the Cu extraction processes such as flotation and direct leaching. For the first time, scanning tunneling microscopy (STM) observation with atomic resolution on CuFeS₂ surfaces has been achieved using cleaved natural chalcopyrite crystals at low temperatures. The surfaces with (011) and (012) orientations have been identified by STM observation, electron backscattering, and X-ray diffraction. (011) surfaces of two different types were observed. The one is a reconstructed surface, and the other surface has a structure that is close to that of a bulk terminated surface.

Atomically resolved image of CuFeS₂ (011) surface.