In order to study the segregation or crystal deformation in crystallites in polycrystalline specimens, a new type X-ray camera has been made. The camera has a rotating cylinder, at one end of which the specimen plate is fixed. The slit system of this camera consists of two pin-holes, 0.03 mmø each, fixed in the camera body apart 0.38mm from the rotating axis of the specimen. The film cassette is fixed on the camera body parallel to the specimen plate. Then, as the specimen is rotated, irradiated point on the specimen moves from place to place continuously along a circle of 0.38 mm radius. Diffraction patterns appear in several arc lines, and by measuring the shape and sharpness of these diffracted arc lines, irregularities along one grain boundary to the next of the crystallite can be accurately found.
The camera has been tested for a pure Al plate (grain size 3mmø) and a Cu-Be alloy plate (grain size 1 mmø, age-hardened) with satisfactory results.