銀薄膜面での光の反果位相差
1961 年 30 巻 10 号 p. 742-744
詳細
1961 年 30 巻 10 号 p. 742-744
Phase lag of light wave by reflection on Ag thin films is measured from the shift of interference fringes. The results agree with those calculated theoretically. Phase lag of thin films thinner than 300 Å differs from that of bulk metal and the calculated maximum phase difference of 0.41 rad. occurs when the film thickness is 40Å.
