応用物理
Online ISSN : 2188-2290
Print ISSN : 0369-8009
ISSN-L : 0369-8009
EPMA分析における微小析出物の影響
織田 勇三颯田 耕三
著者情報
ジャーナル フリー

1969 年 38 巻 6 号 p. 561-566

詳細
抄録

In the Electron Probe Microanalysis, the effect of grain size in multi-phase systems on the observed X-ray intensities was taken into account, and some experiments were carried out by the use of the ARL-type EPMA.
Theoretical calculation, although a rough one, revealed that the X-ray intensities are greatly affected by the presence of grain or the granularization of elements whose mass absorption coefficient ü or density ρ is considerably from that of the matrix, even if the grain-size is much smaller than the spot-size of the electron beam. For example, Si-Kα intensity from Al-12wt%Si alloy, having precipitated Si particles of the grain-size of 1ü or less (the same order or less compared to the smallest electron beam size or the X-ray emitting area), is about 10% higher than that expected from Birk's formula under the assumption that the specimen is uniform and of the same chemical composition. Experimental results showed rather good agr-eement with theoretical values.

著者関連情報
© 社団法人 応用物理学会
前の記事 次の記事
feedback
Top