応用物理
Online ISSN : 2188-2290
Print ISSN : 0369-8009
EPMAによる多元系試料の定量補正法
磯谷 彰男織田 勇三中島 耕一
著者情報
ジャーナル フリー

1971 年 40 巻 1 号 p. 49-54

詳細
抄録

For a reliable quantitative electron probe microanalysis it is absolutely necessary to make some correction calculations, namely, correction for absorption, atomic number and fluorescence. However the correction calculation procedure for a given material, especially a multi-component system is so complicated that it requires much laborious work.
This paper presents a method for approximate calculation of each element in multi-com-ponent systems from the measured intensities of their characteristic X-ray radiations.
The results clearly show that the proposed method is very useful for obtaining a quick and accurate determination of the constituent elements in the multi-component systems.

著者関連情報
© 社団法人 応用物理学会
前の記事 次の記事
feedback
Top