応用物理
Online ISSN : 2188-2290
Print ISSN : 0369-8009
ISSN-L : 0369-8009
固体表面分析用 Disappearance Potential Spectroscopy (DAPS) 法
西守 克己徳高 平藏高島 克己
著者情報
ジャーナル フリー

1981 年 50 巻 10 号 p. 1030-1039

詳細
抄録

DAPS measurements were made with a commercial cylindrical-mirror-analyzer (CMA) and low-energy-electron diffraction (LEED) optics used in Auger electron spectroscopy (AES) systems. The in-situ measurements of DAPS and AES were also performed on metal surfaces of Kovar alloy, Ti, Cr, Fe, Ba, La and U.
From the result of the direct comparison between DAPS and SXAPS (soft x-ray appearance potential spectroscopy) spectra on Cr metal surface, it can be shown thatDAPS is free from the details of the deexcitation mechanism following the excitation, but SXAPS depends on them.
The DAPS spectrum of U metal can be clearly obtained in the lower energy region (_??_100 eV) without diffraction effect, and the double peak at the O3 level is observed with the separation of 4.5 eV.
DAPS method is a more surface-sensitive technique and complementary to AES.

著者関連情報
© 社団法人 応用物理学会
前の記事 次の記事
feedback
Top