Oyo Buturi
Online ISSN : 2188-2290
Print ISSN : 0369-8009
New theory of aberration free phase microscopy for charged particle optics
Takashi IKUTA
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Keywords: charged particle optics, wave aberration, aberration correction, aberration free imaging, active image processing, reciprocity theorem, scanning transmission microscope, TEM, STEM
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2002 Volume 71 Issue 4 Pages 389-400

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[in Japanese]

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