Application of Digital Phase Analysis to Far-Infrared Laser Interferometer for the Large Helical Device

抄録

A digital phase analysis technique was applied to a 119-m wavelength far-infrared (FIR) laser interferometer on the Large Helical Device (LHD). High-density plasma measurement without phase jumping was achieved, representing an improvement over measurements made using a conventional analog phase counter. Digital phase analysis became operational at a quarter of the threshold of the analog phase counter. The phase sensitivity was also improved using digital analysis because the noise level was reduced to approximately half that of the conventional analog phase counter. The improved phase sensitivity enabled measurement of small-amplitude fluctuations.