2019 Volume 32 Issue 1 Pages 123-130
Bubble-free filling is required to realize high-throughput mass production in ultraviolet nanoimprint lithography (UV-NIL). UV-NIL in 1-chloro-3,3,3-trifluoropropene (CTFP) and trans-1,3,3,3-tetrafluoro-propene (TFP) gases has enabled bubble-free UV nanoimprinting of spin-coated films without a vacuum. We evaluate the amount of gas dissolution of 24 organic solvents, which was measured using an electronic balance in a glove box with saturated gases of CTFP and TFP, and use the Hansen solubility parameters (HSP) for analysis. Although the HSP teas graph indicated the same solubility trend in TFP and CTFP atmospheres, the amount of TFP gas dissolution was 1/5th that of CTFP. The pattern quality of acrylate UV-curable resins, which absorb well the condensable gases, was also demonstrated by altering the fraction of the introduced condensable gas mixture of TFP/CTFP. Fine line patterns with a width of 16 nm were obtained by UV-NIL with a high TFP fraction (>66%) in the TFP/CTFP mixed gas atmosphere.
