Proceedings of the Japan Academy, Series B
Online ISSN : 1349-2896
Print ISSN : 0386-2208
ISSN-L : 0386-2208
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The Aharonov-Bohm effect and its applications to electron phase microscopy
Akira TONOMURA
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2006 Volume 82 Issue 2 Pages 45-58

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Abstract

The Aharonov-Bohm effect was conclusively established by a series of our electron interference experiments, with the help of some advanced techniques, such as coherent field-emission electron beams and microlithography. Using this fundamental principle behind the interaction of an electron wave with electromagnetic fields, new observation techniques were developed to directly observe microscopic objects and quantum phenomena previously unobservable.


(Communicated by Jun KONDO, M.J.A.)

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© 2006 The Japan Academy
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