Proceedings of the Japan Academy, Series B
Online ISSN : 1349-2896
Print ISSN : 0386-2208
ISSN-L : 0386-2208
Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS) as a New Tool for Solid Surface Characterization
Yoshimasa NIHEI, Masanori OWARI, Naoto KOSHIZAKI, Masahiro KUDO, Hitoshi KAMADA
Author information
JOURNAL FREE ACCESS

1980 Volume 56 Issue 10 Pages 654-659

Details
Download PDF (512K)
Download citation RIS

(compatible with EndNote, Reference Manager, ProCite, RefWorks)

BIB TEX

(compatible with BibDesk, LaTeX)

Text
How to download citation
Contact us
Article 1st page
Content from these authors
© The Japan Academy
Previous article Next article
Favorites & Alerts

Recently viewed articles
Predecessor

Proceedings of the Imperial Academy

Proceedings of the Japan Academy

Share this page
feedback
 Top