Proceedings of JSPE Semestrial Meeting
2002 JSPE Autumn Meeting
Session ID : M08
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3D profile measurement by colored pattern projection (1st report), system calibration
*Chanin Sinlapeecheewa[in Japanese]
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CONFERENCE PROCEEDINGS FREE ACCESS

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Abstract
A shape measurement system using the scanning of stripes or time sequential space encoding with b/w pattern has been developed. However. It needs a period of time for capturing the images. In order to reduce the time period, the colored pattern projection using two cameras simultaneously capture the image is being developed. Since the accuracy of the parameters is very effective to this method, the accurate geometric calibration of the cameras and projector will be presented.
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© 2002 The Japan Society for Precision Engineering
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