Proceedings of JSPE Semestrial Meeting
2013 JSPE Autumn Conference
Session ID : H02
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Sensitivity Analysis of Transparent Film Thickness Measurement by Three-wavelength Interference Color Analysis Method
*Katsuichi Kitagawa
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Abstract
We have developed a novel film thickness measurement algorithm (GMFT), which estimates the film thickness distribution from a color image captured by a color camera and three-wavelength light source. In this paper, we present some results of sensitivity analysis and discuss the measurement posibility of ultra-thin films.
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© 2013 The Japan Society for Precision Engineering
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