Proceedings of JSPE Semestrial Meeting
2013 JSPE Spring Conference
Session ID : F68
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Host: The Japan Society for Precision Engineering

Imaging of chromosome using a scanning ion conductance microscopy in AC bias mode
*Kimihiro Ishizaki, Masato Nakajima, Tatsuo Ushiki, Futoshi Iwata
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Keywords: SCANNING ION CONDUCTANCE MICROSCOPY
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[in Japanese]
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© 2013 The Japan Society for Precision Engineering
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