QUARTERLY JOURNAL OF THE JAPAN WELDING SOCIETY
Print ISSN : 0288-4771
Perimeter Measurement by Dual Lines Scanning Method
Algorithm and Accuracy of Measurement
Katsuyuki NakashimaYutaka ObuchiKatsunori Inoue
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1990 Volume 8 Issue 4 Pages 470-475

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Abstract

A new algorithm for perimeter measurement for a binary image has been developed. The adjacent two horizontal lines in the image are scanned simultaneously in this algorithm, therefore it is named as DLS(Dual Lines Scanning) method. Its performance is very fast, so suitable for real time measurement, and also its construction is so simple that hardware design is easy.
It is proved that the accuracy of measurement in this method increases by employing rectangular pixel with large vertical-horizontal ratio through experimental analysis. This fact is opposed to the intuitive common sense, then the consideration is made on that cause. The simulation is also made on the characteristics of measurement for the simple figure image.
As the conclusion, this algorithm is very useful for industrial application, especially for measuring moving objects because of the high-speed and simple configuration.

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