2009 Volume 61 Issue 6 Pages 955-958
The authors developed a device to move a probe along 3 axes with a manipulator that has a resolution of 1nm under an electron microscope. The device was developed to measure mechanical properties of nanowire. The mechanical properties of nanowire were measured by applying force to it and deflecting it with the above device. The results were Young’s modulus of 7.5GPa and rupture stress of 18GPa. And we clarified that nanowire breaks in brittle mode. [This abstract is not included in the PDF]