Preface to the Special Issue

Journal of The Society of Instrument and Control Engineers

Online ISSN : 1883-8170
Print ISSN : 0453-4662
ISSN-L : 0453-4662

Preface to the Special Issue

Akira ONO

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Keywords: national measurement standards, international comparison, traceability, mutual recognition

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2001 Volume 40 Issue 7 Pages 477-478

DOI https://doi.org/10.11499/sicejl1962.40.477

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© The Society of Instrument and Control Engineers

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Journal of the Instrument Technology, Japan

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