Metrology Informatics for Ceramic Slurries

Abstract

This review presents new techniques for the measurement of ceramic slurries. First, we have developed a scanning electron-assisted dielectric microscope (SE-ADM) system with energy-dispersive X-ray spectrometry (EDS) that enables direct observation and elemental analysis of nanoparticles in solution. This system facilitates the understanding of alumina particle dispersion states in solution, binder distribution, and silica and magnesium particle bonding states. Furthermore, we demonstrate a dynamic approach to evaluate adsorptive interactions between ceramic particles and polymeric binders entangled in a slurry by utilizing differential centrifugal sedimentation (DCS). The settling of particles under a centrifugal force field exerts significant viscous resistance on the adsorbed binder, leading to its detachment, influenced by particle size and density. This behavior directly reflects the particle-binder interactions, and detailed DCS spectrum analysis enables the quantitative assessment of nano-Newton-order adsorption forces.