粉体工学会誌
Online ISSN : 1883-7239
Print ISSN : 0386-6157
原子間力顕微鏡を用いた湿潤雰囲気下での粒子・平板間付着力の測定
福西 晃朗森 康維
著者情報
ジャーナル フリー

2004 年 41 巻 3 号 p. 162-168

詳細
抄録

Using an atomic force microscope (AFM), adhesion forces between glass particles or AFM tips and hydrophilic or hydrophobic substrates were measured as a function of relative humidity (RH). The observed adhesion force between the glass particle and the hydrophilic substrate increased with RH, due to strong capillary condensation. In contrast, the adhesion force between the glass particle and the hydrophobic substrate was found to be almost constant for all RH, due to weak capillary condensation. The adhesion force between an AFM tip and a mica plate had a maximum value at a certain RH. This can be evaluated by calculating with consideration for the tip shape. On the other hand, the adhesion force for a silica plate increased drastically over a certain RH, and could be explained due to the surface roughness of the silica plate. The presence of nanometer scale roughness can play a critical role in the absolute value of the adhesion force between an AFM tip and the substrate in humid atmosphere.

著者関連情報
© 粉体工学会
前の記事 次の記事
feedback
Top