Quantitative Analysis of Zn-Fe Alloy Galvanized Layer by Secondary Ion Mass Spectrometry

Abstract

A method was established for quantitative analysis of Zn-Fe alloy galvanized layer by using Secondary Ion Mass Spectrometry. O₂⁺, N₂⁺, Ar⁺and Cs⁺ were used as the primaries. The sputtering yield and the relative secondary ion yield were found to depend on the alloy composition. The relative secondary ion yield, f(C_x) can be shown as a function of the alloy composition and the ratio of f(C_zn) to f(C_Fe) was independent of the alloy composition. The sputtering yield, the normalized secondary ion intensity, and relative secondary ion yield were also independent of the primary ion current density.
The secondary ion intensity of Zn and Fe of the Zn-Fe alloy plating by using nitrogen, argon, and cesium as primary ions depended on the coexisting oxygen.
A linear calibration curve can be obtained between the intensity ratio of I_Zn/I_Fe and the ratio of C_Zn/C_FeIt was shown that it is possible to analyse quantitatively the double-layered Zn-Fe alloy plating of micro-sized areas.