Effects of Carbon, Silicon and Manganese on Optical Emission Spectrochemical Analysis for Sulfur in Steel

Harumi NIMBE; Yuichi KANEKO; Yuji OKUYAMA; Kichiro ASANUMA

doi:10.2355/tetsutohagane1955.76.12_2198

Harumi NIMBE, Yuichi KANEKO, Yuji OKUYAMA, Kichiro ASANUMA

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Keywords: element analysis, atomic emission spectrometry, sulfur, interference effect, multiplicative interference effects, correction

JOURNAL FREE ACCESS

1990 Volume 76 Issue 12 Pages 2198-2205

DOI https://doi.org/10.2355/tetsutohagane1955.76.12_2198

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Abstract

Interference effects of carbon, silicon and manganese on optical emission spectrochemical analysis for sulfur in steel were investigated using binaly (Fe-S) and ternary (Fe-S-X) samples.
Multiplicative interference was observed between S and C, and S and Si. The effect of Mn on S determination is due to combination of neighbouring line and multiplicative interference.
Multiplicative interference is diminished by the improvement of the source condition, extending pre-burn time, or using high energy pre-burn, or using special combined spark and dividing measurement, and to apply the Pulse Distribution Analysis (PDA) method.
The accuracy of determination for S is improved using d_j·l_jcorrection method.

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