Electronic Structure of La_0.6Sr_0.4FeO₃ Thin Film by Soft-X-Ray Spectroscopy

抄録

  The electronic structure of La_0.6Sr_0.4FeO₃ thin film on MgO substrate has been studied using resonant soft-X-ray emission spectroscopy (SXES) and X-ray absorption spectroscopy (XAS). The thin film has the mixed valence states of Fe²⁺ and Fe³⁺ in the ground state. The valence band is mainly composed of O 2p state hybridized with t_2g and e_g states of Fe 3d. The conduction band is composed of t_2g and e_g states of Fe 3d. and hole-induced state created by Sr doping. These findings accord with the result of electronic structure expected by tight-binding calculation that included the effect of electron-electron interaction.