IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
Special Section on Electronic Displays
Comparison of Friction Characteristics on TN and VA Mode Alignment Films with Friction Force Microscopy
Musun KWAKHanrok CHUNGHyukmin KWONJehyun KIMDaekyung HANYoonseon YISangmun LEEChulgu LEESooyoul CHA
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2009 Volume E92.C Issue 11 Pages 1366-1370

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Abstract
Using frictional force microscopy (FFM), the friction surface characteristics were compared between twisted nematic (TN) mode and vertical alignment (VA) mode alignment films (AFs). The friction asymmetry was detected depending on temperature conditions on TN mode AF, but not on VA mode AF. The difference between two modes was explained by leaning intermolecular repulsion caused by the pre-tilt angle uniformity and the density of side chain. No level difference according to temperature conditions appeared when the pre-tilt angle were measured after liquid crystal (LC) injection.
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© 2009 The Institute of Electronics, Information and Communication Engineers
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