Observation of Tin Plated Fretting Contacts Using FIB-SEM

Tetsuya ITO; Yoshiyuki NOMURA; Yasuhiro HATTORI

doi:10.1587/transele.E93.C.1452

Special Section on Recent Development of Electro-Mechanical Devices (Selected Papers from IS-EMD2009)

Observation of Tin Plated Fretting Contacts Using FIB-SEM

Tetsuya ITO, Yoshiyuki NOMURA, Yasuhiro HATTORI

著者情報

キーワード: fretting, FIB-SEM, tin plating thickness

ジャーナル認証あり

2010 年 E93.C 巻 9 号 p. 1452-1455

DOI https://doi.org/10.1587/transele.E93.C.1452

詳細

抄録

In this report, Focused Ion Beam (FIB) — SEM technique was applied to observe the tin plated fretting contacts. Spatial distributions of tin, tin oxide and so on have been confirmed quantitatively in two plating thickness of 1 and 5µm.

責任著者(Corresponding author)

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