IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Online ISSN : 1745-1337
Print ISSN : 0916-8508
Special Section on VLSI Design and CAD Algorithms
X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction
Youhua SHINozomu TOGAWAMasao YANAGISAWATatsuo OHTSUKI
Author information
JOURNALS RESTRICTED ACCESS

2009 Volume E92.A Issue 12 Pages 3119-3127

Details
Abstract

This paper presents a novel X-handling technique, which removes the effect of unknowns on compacted test response with maximal compaction ratio. The proposed method combines with the current X-tolerant compactors and inserts masking cells on scan paths to selectively mask X's. By doing this, the number of unknown responses in each scan-out cycle could be reduced to a reasonable level such that the target X-tolerant compactor would tolerate with guaranteed possible error detection. It guarantees no test loss due to the effect of X's, and achieves the maximal compaction that the target response compactor could provide as well. Moreover, because the masking cells are only inserted on the scan paths, it has no performance degradation of the designs. Experimental results demonstrate the effectiveness of the proposed method.

Information related to the author
© 2009 The Institute of Electronics, Information and Communication Engineers
Previous article Next article
feedback
Top