1993 年 17 巻 22 号 p. 7-11
A former X-ray non-destructive inspection equipment has been using X-ray that has over 20KeV energy (hard X-ray) and is suitable to take and image of material that's main component is heavy element, but it has a defect that it is impossible to get high contrast as imaging light element material. So it is required to use very low energy X-ray in order to take a high contrast image in that case. An overall excellent detector that is possible to take an image under 20KeV with TV system has not been produced yet. So, we have developed an X-ray non-destructive inspection equipment to aim using more than 4KeV X-ray in order that we can inspect easily light element material in high quality image.