表面と真空
Online ISSN : 2433-5843
Print ISSN : 2433-5835
SPM特集号「プローブ顕微鏡によるナノサイエンスの最前線」
周波数変調原子間力顕微鏡で測定するエネルギー散逸
新井 豊子
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ジャーナル 認証あり

2018 年 61 巻 10 号 p. 632-638

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Frequency modulation atomic force microscopy (FM-AFM) can simultaneously detect the conservative and non-conservative force interactions between a tip and a sample, based on the resonance frequency shift (Δf) and the mechanical energy dissipation of an oscillating cantilever, respectively. Here, we outline the energy dissipation measured by FM-AFM and introduce our recent results obtained through measurement of the energy dissipation. First, surface resistances can be evaluated in non-contact using the proportional relationship between the energy dissipation due to Joule heat and Δf due to the electrostatic attractive force. Second, Si adatoms on a Si(111)-(7×7) surface, which are observed to be static by FM-AFM, can move back and force between their stable sites and their neighboring quasi-stable sites, detected by measuring of the energy dissipation.

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