2018 年 61 巻 10 号 p. 651-656
Combination of scanning tunneling microscope with inelastic electron tunneling spectroscopy (STM-IETS) enables us to investigate the vibration of a molecule on a surface at the atomic scale spatial resolution. However it was known that the intensity of IETS strongly depends on each tip. Here we have further incorporated atomic force microscopy (AFM) to characterize the geometrical structure of a tip apex and investigated the tip apex geometry dependent IETS for a CO molecule on a Cu(111) surface. We demonstrate for a metallic tip that the ratio of the current passing through a CO molecule to the bypass current is a critical factor to determine the intensity of IETS.